reflection electron microscopy

基本解释

The surface of synthetic diamond have been observed employing reflection electron microscopy with both TBM and STEM instrument.
本文用反射电子显微术观察了合成金刚石表面。
Through the infrared reflection spectroscopy, scanning electron microscopy, electrochemical impedance spectroscopy, contact angle to do depth analysis and testing.
通过红外反射光谱，扫描电镜，电化学交流阻抗，耐化学介质等手段对涂料进行了深入的分析和测试。
The surface microstructures of spherical Pt single crystals are studied by reflection electron microscopy, and the defect configurations in the crystals are also analysed.
本文用反射电子显微术观察了球状铂单晶表面的微观结构，分析了单晶形成中内部缺陷的变化。