electron backscatter diffraction

基本解释

A new kind of method for studying critical materials-electron backscatter diffraction (EBSD) analysis technology was introduced.
介绍了一种新型的晶体材料研究方法——电子背散射衍射分析技术。
EBSD (electron backscatter diffraction) is a relatively new, scanning electron microscope-based technique used to characterize microstructures and textures in polycrystalline materials.
电子背散射衍射（EBSD）是一种较新的，用来分析多晶材料显微结构和组织的扫描电子显微镜技术。
Since the quality of metallographic sample has great effect on the accuracy and precision of testing results, several preparations of electron backscatter diffraction(EBSD) sample are introduced.
电子背散射衍射样品的制备质量对其成像效果的影响至关重要，着重介绍了几种有效的样品制备方法。